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Publication date Communities Collections Article title Author(s) Journal/Conference
24 Feb 2026 SERC Institute for Infocomm Research AI-Powered Super-Resolution for Scalable and Efficient 3D X-Ray Inspection of 3D-Stacked HBMs Yang Yu, Kangkang Lu, Jie Wang, Richard Chang, Meng Keong Lim, Ser Choong Chong, Ramanpreet Singh Pahwa, Xulei Yang 2025 IEEE 27th Electronics Packaging Technology Conference (EPTC)
26 Jun 2025 SERC Institute for Infocomm Research An Efficient Data Augmentation and Semantic Segmentation Framework for 3D Defect Detection of HBMs Yang Yu, Jie Wang, Richard Chang, Ser Choong Chong, Ramanpreet Singh Pahwa, Xulei Yang 2025 IEEE 75th Electronic Components and Technology Conference (ECTC)
18 Jan 2023 SERC Institute for Infocomm Research Improved Bump Detection and Defect Identification for HBMs using Refined Machine Learning Approach Wang Jie, Richard Chang, Xu Xun, Cai Lile, Chuang Sheng Foo, Ramanpreet Singh Pahwa 2022 IEEE 24th Electronics Packaging Technology Conference (EPTC)
12 Jul 2022 SERC Institute for Infocomm Research Automated Detection and Segmentation of HBMs in 3D X-ray Images using Semi-Supervised Deep Learning Ramanpreet Singh Pahwa, Richard Chang, Wang Jie, Xu Xun, Oo Zaw Min, Foo Chuan Sheng, Chong Ser Choong, Vempati Srinivasa Rao 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)
21 Jun 2022 SERC Institute for Infocomm Research A Simulation Approach to Analyze Bridge-Defects in a 6T-SRAM Bit Cell Joydeep Ghosh, Shang Yi Lim, Ferdaus Md. Meftahul, Senthilnath Jayavelu, Aaron Voon-Yew Thean 2022 6th IEEE Electron Devices Technology Manufacturing Conference (EDTM)
10 Nov 2020 SERC Institute for Infocomm Research A Hybrid Deep Learning Based Framework for Component Defect Detection of Moving Trains Cen Chen, Kenli Li, Zhongyao Cheng, Francesco Piccialli, Steven C. H. Hoi, Zeng Zeng IEEE Transactions on Intelligent Transportation Systems
27 Oct 2019 SERC Institute for Infocomm Research FaultNet: Faulty Rail-Valves Detection using Deep Learning and Computer Vision Ramanpreet Pahwa, Jin Chao, Jestine Paul, Yiqun Li, Tin Lay Nwe Ma, Shudong Xie, Ashish James, Arulmurugan Ambikapathi, Zeng Zeng, Vijay Chandrasekhar IEEE-ITSC 2019