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21 Jun 2022 SERC Institute for Infocomm Research A Simulation Approach to Analyze Bridge-Defects in a 6T-SRAM Bit Cell Joydeep Ghosh, Shang Yi Lim, Ferdaus Md. Meftahul, Senthilnath Jayavelu, Aaron Voon-Yew Thean 2022 6th IEEE Electron Devices Technology Manufacturing Conference (EDTM)