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Publication date Communities Collections Article title Author(s) Journal/Conference
21 Jun 2022 SERC Institute for Infocomm Research A Simulation Approach to Analyze Bridge-Defects in a 6T-SRAM Bit Cell Joydeep Ghosh, Shang Yi Lim, Ferdaus Md. Meftahul, Senthilnath Jayavelu, Aaron Voon-Yew Thean 2022 6th IEEE Electron Devices Technology Manufacturing Conference (EDTM)
21 Apr 2022 SERC Institute for Infocomm Research Significance of activation functions in developing an online classifier for semiconductor defect detection Md Meftahul Ferdaus, Bangjian Zhou, Ji Wei Yoon, Kain Lu Low, Jieming Pan, Joydeep Ghosh, Min Wu, Xiaoli Li, Aaron Voon-Yew Thean, J. Senthilnath Knowledge-Based Systems
28 Jun 2021 SERC Institute for Infocomm Research Transfer Learning-Based Artificial Intelligence-Integrated Physical Modeling to Enable Failure Analysis for 3 Nanometer and Smaller Silicon-Based CMOS Transistors Jieming Pan, Kain Lu Low, Joydeep Ghosh, Senthilnath Jayavelu, Md Meftahul Ferdaus, Shang Yi Lim, Evgeny Zamburg, Yida Li, Baoshan Tang, Xinghua Wang, Jin Feng Leong, Savitha Ramasamy, Tonio Buonassisi, Chen-Khong Tham, Aaron Voon-Yew Thean ACS Applied Nano Materials