3D Stacking of Heterogeneous Chiplets on Modified FOWLP Platform with Thru-Silicon Redistribution Layer

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3D Stacking of Heterogeneous Chiplets on Modified FOWLP Platform with Thru-Silicon Redistribution Layer
Title:
3D Stacking of Heterogeneous Chiplets on Modified FOWLP Platform with Thru-Silicon Redistribution Layer
Journal Title:
2023 IEEE 73rd Electronic Components and Technology Conference (ECTC)
Keywords:
Publication Date:
03 August 2023
Citation:
Chong, C. T., Long, L. B., Siang, S. L. P., Wee, D. H. S., van Kampen, R., Castillou, P., Gaddi, R., Barron, L., Renault, M., Ko, J., & Hammond, J. (2023, May). 3D Stacking of Heterogeneous Chiplets on Modified FOWLP Platform with Thru-Silicon Redistribution Layer. 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC). https://doi.org/10.1109/ectc51909.2023.00012
Abstract:
A 3D stacking of CMOS on RF device chiplet is demonstrated for significant reduction of areal form factor for Front-End Module (FEM) application. The salient points of the process integration of thru-silicon redistribution layer on the backside of RF device wafer, chip-to-wafer bonding and assembly, measurement of the interconnection and reliability assessment will be discussed.
License type:
Publisher Copyright
Funding Info:
There was no specific funding for the research done
Description:
© 2023 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
ISSN:
2377-5726
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