| Publication date | Communities | Collections | Article title | Author(s) | Journal/Conference |
|---|---|---|---|---|---|
| 21 Jun 2022 | SERC | Institute for Infocomm Research | A Simulation Approach to Analyze Bridge-Defects in a 6T-SRAM Bit Cell | Joydeep Ghosh, Shang Yi Lim, Ferdaus Md. Meftahul, Senthilnath Jayavelu, Aaron Voon-Yew Thean | 2022 6th IEEE Electron Devices Technology Manufacturing Conference (EDTM) |