Citation:
Sarafianou, M., Wai Choong, D. S., Jian Goh, D., Liu, J., Merugu, S., Zhang, Q. X., Chang, P. H. K., Giusti, D., Castoldi, L., D’Ercoli, F., Tacchini, R., Leotti, A., Sim, D. H., Stuart Savoia, A., & Lee, J. E.-Y. (2023, September 3). DC-Bias Effects on Sputtered PZT pMUTs with High Transmit and Receive Sensitivities in Immersion for Imaging applications. 2023 IEEE International Ultrasonics Symposium (IUS). https://doi.org/10.1109/ius51837.2023.10307325