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Publication date Communities Collections Article title Author(s) Journal/Conference
7 Nov 2023 SERC Institute of Microelectronics DC-Bias Effects on Sputtered PZT pMUTs with High Transmit and Receive Sensitivities in Immersion for Imaging applications Mantalena Sarafianou, David Sze Wai Choong, Duan Jian Goh, Jihang Liu, Srinivas Merugu, Qing Xin Zhang, Peter H. K. Chang, Domenico Giusti, Laura Castoldi, Filippo D’Ercoli, Riccardo Tacchini, Alberto Leotti, Dao Hao Sim, Alessandro Stuart Savoia, Joshua En-Yuan Lee 2023 IEEE International Ultrasonics Symposium (IUS)
3 Aug 2023 SERC Institute of Microelectronics Development of PMUT Array Packaging from Characterisation Prototypes to Customer Samples Dominico Giusti, Alex Gritti, Fabio Quaglia, Alessandro Stuart Savoia, Hideyuki Sandoh, Gerald Klug, Hitoshi Hoshino, Dutta Rahul, Vempati Srinivasa Rao, David Ho Soon Wee, Masatoshi Wakahara, Mark Shaw 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC)
13 Nov 2021 SERC Institute of Microelectronics Silicon-On-Nothing ScAlN pMUTs David Sze Wai Choong, Daniel Ssu-Han Chen, Duan Jian Goh, Jihang Liu, Sagnik Ghosh, Yul Koh, Jaibir Sharma, Srinivas Merugu, Fabio Quaglia, Marco Ferrera, Alessandro Stuart Savoia, Eldwin Jiaqiang Ng 2021 IEEE International Ultrasonics Symposium (IUS)
12 Nov 2021 SERC Institute of Microelectronics High Resolution, High Frequency Ultrasonic Ranging in Air with pMUTs Yul Koh, David Sze Wai Choong, Daniel Ssu-Han Chen, Duan Jian Goh, Sagnik Ghosh, Jaibir Sharma, Srinivas Merugu, Fabio Quaglia, Marco Ferrera, Alessandro Stuart Savoia, Eldwin Jiaqiang Ng 2021 IEEE International Ultrasonics Symposium (IUS)