| Publication date | Communities | Collections | Article title | Author(s) | Journal/Conference |
|---|---|---|---|---|---|
| 7 Nov 2023 | SERC | Institute of Microelectronics | DC-Bias Effects on Sputtered PZT pMUTs with High Transmit and Receive Sensitivities in Immersion for Imaging applications | Mantalena Sarafianou, David Sze Wai Choong, Duan Jian Goh, Jihang Liu, Srinivas Merugu, Qing Xin Zhang, Peter H. K. Chang, Domenico Giusti, Laura Castoldi, Filippo D’Ercoli, Riccardo Tacchini, Alberto Leotti, Dao Hao Sim, Alessandro Stuart Savoia, Joshua En-Yuan Lee | 2023 IEEE International Ultrasonics Symposium (IUS) |