| Publication date | Communities | Collections | Article title | Author(s) | Journal/Conference |
|---|---|---|---|---|---|
| 27 Sep 2023 | SERC | Institute of Microelectronics | Stress effect on the leakage current distribution of ferroelectric Al0.7Sc0.3N across the wafer | Wanwang Yang, Li Chen, Minghua Li, Fei Liu, Xiaoyan Liu, Chen Liu, Jinfeng Kang | Applied Physics Letters |