| Publication date | Communities | Collections | Article title | Author(s) | Journal/Conference |
|---|---|---|---|---|---|
| 29 Sep 2023 | SERC | Institute of Microelectronics | Performance Improvement via Stack Engineering and Post-bake Retention State Stabilization in Fully CMOS Compatible HfO2-based RRAM | Subhranu Samanta, Chen Zhixian, Hock Koon Lee, Weijie Wang, Song Wendong, Yao Zhu, Li Chen, Chen Liu | 2023 IEEE International Symposium on Applications of Ferroelectrics (ISAF) |