DC Bias Effects on Optimizing ScAlN Air-Coupled pMUT Performance Parameters

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DC Bias Effects on Optimizing ScAlN Air-Coupled pMUT Performance Parameters
Title:
DC Bias Effects on Optimizing ScAlN Air-Coupled pMUT Performance Parameters
Journal Title:
2023 IEEE SENSORS
Keywords:
Publication Date:
28 November 2023
Citation:
Choong, D. S. W., Goh, D. J., Liu, J., Sarafianou, M., Merugu, S., Zhang, Q. X., Chang, P., Leotti, A., Koppisetti, G., Zakiyyan, N., Lin, H., Bhasetti, C., Ghosh, S., Ramegowda, P. C., Chen, D. S.-H., Lee, J. E.-Y., Prelini, C., Giusti, D., Savoia, A., & K, Yul. (2023). DC Bias Effects on Optimizing ScAlN Air-Coupled pMUT Performance Parameters. 2023 IEEE SENSORS, 1–4. https://doi.org/10.1109/sensors56945.2023.10325160
Abstract:
In this work, we demonstrate that the performance of ScAlN pMUTs can be enhanced by adjusting DC bias voltages. DC biases up to 80 V on ScAlN pMUTs contribute to film stress alleviation and enhance pMUT performance. Laser Doppler Vibrometry characterization was performed to evaluate an improvement in displacement transfer according to the DC bias, as well as to investigate the ferroelectric effect of 15% scandium-doped AlN film. As a result, both transmission sensitivity and receive sensitivity are improved by 11% and 50%, respectively, at 80V bias compared to 0V. Additionally, a 55% enlargement in the -3dB bandwidth (BW) has been achieved.
License type:
Publisher Copyright
Funding Info:
This research / project is supported by the Agency for Science, Technology and Research - Piezo Specialty Lab-in-a-Fab (LIF 1.0)
Grant Reference no. : I1901E0050

This research / project is supported by the Agency for Science, Technology and Research - Nanosystems at the Edge
Grant Reference no. : A18A4b0055
Description:
© 2023 IEEE.  Personal use of this material is permitted.  Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
ISSN:
1558-1748
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