| Publication date | Communities | Collections | Article title | Author(s) | Journal/Conference |
|---|---|---|---|---|---|
| 28 Nov 2023 | SERC | Institute of Microelectronics | Iterative Analysis Approach using interactive Python-FEM to estimate the residual stresses in PMUTs | Prakasha C. Ramegowda, D. S. W. Choong, D. J. Goh, L. Jihang, S. Merugu, P. Chang, A. Leotti, D. Giusti, C. Prelini, S. Ghosh, J. E.-Y. Lee, Y. Koh | 2023 IEEE SENSORS |
| 28 Nov 2023 | SERC | Institute of Microelectronics | DC Bias Effects on Optimizing ScAlN Air-Coupled pMUT Performance Parameters | D. S. W. Choong, D. J. Goh, J. Liu, M. Sarafianou, S. Merugu, Q. X. Zhang, P. Chang, A. Leotti, G. Koppisetti, N. Zakiyyan, H. Lin, C. Bhasetti, S. Ghosh, P. C. Ramegowda, D. S.-H. Chen, J. E.-Y. Lee, C. Prelini, D. Giusti, A. Savoia, Yul. K | 2023 IEEE SENSORS |