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2 Dec 2025 SERC Institute for Infocomm Research AI-driven Pixel-Level Defect Localization using Magnetic Current Images (Pending publish) Aye Phyu Phyu Aung, Lucas Yu Xiang Lum, Bernice Zee, Jiann Min Chin, Yeow Kheng Lim, Senthilnath Jayavelu 27th Electronics Packaging Technology Conference