| Publication date | Communities | Collections | Article title | Author(s) | Journal/Conference |
|---|---|---|---|---|---|
| 31 Mar 2026 | SERC | Institute for Infocomm Research | AI-driven Pixel-Level Defect Localization using Magnetic Current Images | Aye Phyu Phyu Aung, Lucas Yu Xiang Lum, Bernice Zee, Jiann Min Chin, Yeow Kheng Lim, Senthilnath Jayavelu | 27th Electronics Packaging Technology Conference |