Identifying the Limits of Strain Engineering in NaNbO3 Ultrathin Films

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Identifying the Limits of Strain Engineering in NaNbO3 Ultrathin Films
Title:
Identifying the Limits of Strain Engineering in NaNbO3 Ultrathin Films
Journal Title:
ACS Applied Materials & Interfaces
Publication Date:
16 July 2025
Citation:
Zeng, S., Ong, K. P., Solco, S. F. D., Lim, Z. S., Zeng, Q., Lin, B., Luo, J., Zhao, W., Luo, T., Cai, W., Ye, Z., Sim, C., Tan, C. K. I., Ramakrishna, S., Lam, Y. M., Ariando, A., & Liu, H. (2025). Identifying the Limits of Strain Engineering in NaNbO3 Ultrathin Films. ACS Applied Materials & Interfaces, 17(30), 43227–43234. https://doi.org/10.1021/acsami.5c09069
Abstract:
Epitaxial NaNbO3 ultrathin films are grown on single crystal substrates with a wide range of compressive (-6.24%) and tensile (+7.13%) strain. High-resolution X-ray diffraction reveals a coherently strained state of NaNbO3 thin films within the strain range from -1.42 % to 1.86 %, beyond which the films are in relaxed states. This is accompanied by a change in the growth mode from step-flow growth in strained films to coalesced island growth in relaxed films. Piezoresponse force microscopy measurements, including domain writing and reading, reveal a single vertical ferroelectric domain for the compressive films, while the tensile films exhibit a mixture of multiple vertical domains. The first-principles calculations confirm the stability of the strained NaNbO3. Our results provide important information for the understanding and engineering of strained functional thin films.
License type:
Publisher Copyright
Funding Info:
This research / project is supported by the National Research Foundation - Competitive Research Program
Grant Reference no. : NRF-CRP28-2022-0002

This research / project is supported by the A*STAR - Manufacturing, Trade, and Connectivity Individual Research Grant
Grant Reference no. : M22K2c0084

This research / project is supported by the A*STAR - Central Research Fund
Grant Reference no. :

This research / project is supported by the Ministry of Education - Academic Research Fund Tier 2 and 3
Grant Reference no. : MOE-T2EP50121-0018, MOE-T2EP50123-0013, MOE-MOET32023-0003
Description:
This document is the Accepted Manuscript version of a Published Work that appeared in final form in ACS Applied Materials & Interfaces, copyright © American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see 10.1021/acsami.5c09069.
ISSN:
1944-8244
1944-8252
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