Quarter Waveplate at Upper Terahertz Range based on Form Birefringence

Quarter Waveplate at Upper Terahertz Range based on Form Birefringence

2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)

10.1109/IRMMW-THz.2013.6665828

https://doi.org/10.1109/IRMMW-THz.2013.6665828

Banghong Zhang, Yandong Gong, Takashi Notake, Hiroaki Minamide

21 November 2013

B. Zhang, Y. Gong, T. Notake and H. Minamide, "Quarter waveplate at upper terahertz range based on form birefringence," 2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2013, pp. 1-2, doi: 10.1109/IRMMW-THz.2013.6665828.

Quarter waveplates (QWPs) at upper terahertz range are demonstrated based on form birefringence of silicon grating. With depth of 15.5 and 8.4 μm, the gratings act as QWPs at 4.9 and 9.5 THz, respectively. The QWP is also successfully used to measure the state of polarization in a polarimetric system.

Publisher Copyright

This work is supported by the international joint project between A*STAR of Singapore and JST of Japan with A-STAR/SERC/SICP grant No. 1021630069.

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https://oar.a-star.edu.sg/communities-collections/articles/11469

2162-2035
2162-2027

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Institute for Infocomm Research