| Publication date | Communities | Collections | Article title | Author(s) | Journal/Conference |
|---|---|---|---|---|---|
| 24 Feb 2026 | SERC | Institute of Materials Research and Engineering | Anomalyspy: A Generative Defect Localization in Semiconductor Packages, with X-Ray Microscopy | Riko I Made, Pawan Kumar, Pablo Quijano Velasco, Ng Chee Koon, Leong Chang Jie | 2025 IEEE 27th Electronics Packaging Technology Conference (EPTC) |