| Publication date | Communities | Collections | Article title | Author(s) | Journal/Conference |
|---|---|---|---|---|---|
| 8 Oct 2021 | SERC | National Metrology Centre | On-site comparison of Quantum Hall Effect resistance standards of the NMC A*STAR and the BIPM: Ongoing key comparison BIPM.EM-K12 | Pierre Gournay, Benjamin Rolland, Sze Wey Chua, Kuang Hoong Lim, Eddie Tan Boon Teck | Metrologia |