Readout Error Mitigation for Mid-Circuit Measurements and Feedforward

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Readout Error Mitigation for Mid-Circuit Measurements and Feedforward
Title:
Readout Error Mitigation for Mid-Circuit Measurements and Feedforward
Journal Title:
PRX Quantum
Keywords:
Publication Date:
26 January 2026
Citation:
Koh, J. M., Koh, D. E., & Thompson, J. (2026). Readout Error Mitigation for Mid-Circuit Measurements and Feedforward. PRX Quantum, 7(1). https://doi.org/10.1103/cj89-4h5t
Abstract:
Current quantum computing platforms suffer from readout errors, where faulty measurement outcomes are reported by the device. These errors are particularly harmful in quantum programs that rely on branch statements, where operations in later parts of the program are dynamically determined by mid-circuit measurements. We propose a general protocol for mitigating mid-circuit measurement errors. Our solution works for any number of mid-circuit measurement and feedforward layers without increasing circuit depth or two-qubit gate counts, is efficient under structural assumptions on error channels, and is suitable for immediate application on noisy intermediate-scale quantum devices. We experimentally demonstrate up to a ∼ 60 % reduction in error on superconducting quantum processors across several practically relevant feedforward circuits, including dynamic qubit resets, shallow-depth Greenberger–Horne–Zeilinger state preparation, and multistage quantum teleportation. This work paves the way for more error-resilient adaptive quantum circuits, crucial for current and future quantum computing applications.
License type:
Attribution 4.0 International (CC BY 4.0)
Funding Info:
This research / project is supported by the Agency for Science, Technology and Research - Central Research Fund
Grant Reference no. : NA

This research / project is supported by the National Research Foundation - Quantum Engineering Programme
Grant Reference no. : NRF2021-QEP2-02-P03, NRF2021-QEP2-02-P06

This research is supported by core funding from: A*STAR
Grant Reference no. : C230917003
Description:
ISSN:
2691-3399