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23 Jun 2021
SERC
Institute of Materials Research and Engineering
N95 respirator decontamination: a study in reusability
C.-G. Wang,
Z. Li,
S. Liu,
C.T. Ng,
M. Marzuki,
P.S. Jeslyn Wong,
B. Tan,
A. Lee,
C.F. Hui Lim,
P. Bifani,
Z. Fang,
J.C. Ching Wong,
Y.X. Setoh,
Y.Y. Yang,
C.H. Mun,
S.Z. Fiona Phua,
W.Q. Lim,
L. Lin,
A.R. Cook,
H. Tanoto,
L.-C. Ng,
A. Singhal,
Y.W. Leong,
X.J. Loh
Materials Today Advances
27 Oct 2014
SERC
Data Storage Institute
Novel Strained SiGe/TaOx/Ta RRAM Device Fabricated by Fully CMOS Compatible Process
Y. Jiang,
C. C. Tan,
E. G. Yeo,
M. H. Li,
W. He,
V. Y.-Q. Zhuo,
Z. Fang,
B. B. Weng
The 14th Non-Volatile Memory Technology Symposium (NVMTS 2014)
29 Jul 2014
SERC
Institute of Microelectronics
Impact of Ni Concentration on the Performance of Ni Silicide/HfO2/TiN Resistive RAM (RRAM) Cells
Z.X. Chen,
Z. Fang,
Y. Wang,
Y. Yang,
A. Kamath,
X.P. Wang,
N. Singh,
G.-Q. Lo,
D.-L. Kwong,
Y.H. Wu
Journal of Electronic Materials
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