| Publication date | Communities | Collections | Article title | Author(s) | Journal/Conference |
|---|---|---|---|---|---|
| 26 Nov 2024 | SERC | Institute of Materials Research and Engineering | Twice reflected ultrasonic bulk wave for surface defect monitoring | Voon-Kean Wong, Xiaotian Li, Yasmin Mohamed Yousry, Marilyne Philibert, Chao Jiang, David Boon Kiang Lim, Percis Teena Christopher Subhodayam, Zheng Fan, Kui Yao | Ultrasonics |