| Publication date | Communities | Collections | Article title | Author(s) | Journal/Conference |
|---|---|---|---|---|---|
| 7 Jul 2015 | SERC | Institute of Microelectronics | Study of Multilevel High-Resistance States in HfO<sub><italic>x</italic></sub>-Based Resistive Switching Random Access Memory by Impedance Spectroscopy | H. K. Li, T. P. Chen, S. G. Hu, P. Liu, Y. Liu, P. S. Lee, X. P. Wang, H. Y. Li, G. Q. Lo | Electron Devices, IEEE Transactions on |