| Publication date | Communities | Collections | Article title | Author(s) | Journal/Conference |
|---|---|---|---|---|---|
| 25 Jun 2020 | SERC | Institute of High Performance Computing | Wafer-Level Characterization of Silicon Nitride CWDM (De)Multiplexers Using Bayesian Inference | Jun Rong Ong, Tina X. Guo, Thomas Y. L. Ang, Soon Thor Lim, Hong Wang, Ching Eng Png | IEEE Photonics Technology Letters |