| Publication date | Communities | Collections | Article title | Author(s) | Journal/Conference |
|---|---|---|---|---|---|
| 3 Nov 2022 | SERC | Institute for Infocomm Research | Correlated Bayesian Co-Training for Virtual Metrology | Cuong Nguyen, Xin Li, Shawn Blanton, Xiang Li | IEEE Transactions on Semiconductor Manufacturing |