| Publication date | Communities | Collections | Article title | Author(s) | Journal/Conference |
|---|---|---|---|---|---|
| 16 Oct 2014 | SERC | Data Storage Institute | Influence of post-deposition annealing on interfacial properties between GaN and ZrO2 grown by atomic layer deposition | Ji Rong, Subramaniam Arulkumaran, Geok Ing Ng, Li Yang, Zhi Hong Liu, Kian Siong Ang, Gang Ye, Hong Wang, Serene Lay Geok Ng | Applied Physics Letters |