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13 Jul 2023 SERC Institute for Infocomm Research Tackling data scarcity with transfer learning: a case study of thickness characterization from optical spectra of perovskite thin films Siyu Isaac Parker Tian, Zekun Ren, Selvaraj Venkataraj, Yuanhang Cheng, Daniil Bash, Felipe Oviedo, J. Senthilnath, Vijila Chellappan, Yee-Fun Lim, Armin G. Aberle, Benjamin P. MacLeod, Fraser G. L. Parlane, Curtis P. Berlinguette, Qianxiao Li, Tonio Buonassisi, Zhe Liu Digital Discovery
30 Nov 2022 SERC Institute for Infocomm Research Extracting film thickness and optical constants from spectrophotometric data by evolutionary optimization Rajdeep Dutta, Siyu Isaac Parker Tian, Zhe Liu, Madhavkrishnan Lakshminarayanan, Selvaraj Venkataraj, Yuanhang Cheng, Daniil Bash, Vijila Chellappan, Tonio Buonassisi, Senthilnath Jayavelu PLOS ONE