| Publication date | Communities | Collections | Article title | Author(s) | Journal/Conference |
|---|---|---|---|---|---|
| 5 Jan 2022 | SERC | Institute of Microelectronics | Testing Multiple High-Speed Channels using Automated Test Equipment (ATE), SOC 93K, in parallel | Ratan Bhimrao Umralkar, Li Kangrong | 2021 IEEE 23rd Electronics Packaging Technology Conference (EPTC) |
| 5 Jan 2022 | SERC | Institute of Microelectronics | Systematic Signal Integrity Analysis on Fine Pitch Probe Card for HBM Interposer Testing | Li Kangrong, Ratan Bhimrao Umralkar | 2021 IEEE 23rd Electronics Packaging Technology Conference (EPTC) |