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Publication date Communities Collections Article title Author(s) Journal/Conference
7 Jun 2023 SERC National Metrology Centre Supplementary comparison on digital multimeter Saood Ahmad, Thomas John, P S Negi, Louis Marais, Flippie Prinsloo, Alexander Matlejoane, Arjuntungalag Jargal, Jutarat Tanarom, Narat Rujirat, Steven Yang, Nor Azrin Hassan, R D M Alanka, Phung Thi KieuLinh, Sabino Paulo B Leones Jr, Joe Panga, Victor Gabi, Ahnan Maruf, Marat Konkanov, Seksembaev Nurlan, Nadia N Tadros, Dr Rasha Sayed, Naser Harba, Mustafa Flaifel, Tay Siew Choon Metrologia
18 Jun 2018 SERC National Metrology Centre Comparison of standards for the calibration of voltage, current and resistance meters Louis Marais, Steven Yang, Brenda Lam, LIU Yue, Thomas John, P S Negi, Hiroaki Sakuma, Eiji Watabe, Sze Wey Chua, Chalit Kumtawee, Yaowaret Pimsut Metrologia
24 Oct 2012 SERC National Metrology Centre Final report on APMP supplementary comparison P1-APMP.EM.RF-S3: APMP comparison of 50 ohm coaxial mismatches Kamlesh Patel, P S Negi, Ram Swarup, Jeong Hwan Kim, Jin-Seob Kang, Michael W K Chow, C M Tsui, Erik Dressler, Wen-Tron Shay, Hua Li, Yueyan Shan Metrologia
25 Sep 2010 SERC National Metrology Centre Final report on APMP attenuation key comparison APMP.EM.RF-K19.CL: Attenuation at 60 MHz and 5 GHz using a Type N step attenuator Gao Qiulai, Liang Weijun, Joo-Gwang Lee, Anton Widarta, Michael W K Chow, Thomas Wu, Stephen Grady, Mariesa Prozesky, Erik Dressler, Kamlesh Patel, P S Negi, Chairat Wichianmongkonkun, Massinee Chanvichitkul Metrologia