| Publication date | Communities | Collections | Article title | Author(s) | Journal/Conference |
|---|---|---|---|---|---|
| 15 Jun 2020 | SERC | Institute for Infocomm Research | Rapid and Accurate Thin Film Thickness Extraction via UV-Vis and Machine Learning | Parker Tian Siyu Isaac, Liu Zhe, Chellappan Vijila, Lim Yee-Fun, Ren Zekun, Oviedo Felipe, Teo B. Heng, Thapa Janak, Dutta Rajdeep, MacLeod Benjamin P, Parlane Fraser G. L., Senthilnath J., Berlinguette Curtis P., Buonassisi Tonio | Proceedings of the 47th IEEE Photovoltaic Specialists Conference (PVSC'20), 2020 |
| 16 Jan 2018 | SERC | Institute of Materials Research and Engineering | Modification of Vapor Phase Concentrations in MoS2 Growth Using a NiO Foam Barrier | Lim Yee-Fun, Priyadarshi Kumar, Bussolotti Fabio, Gogoi Pranjal Kumar, Cui Xiaoyang, Yang Ming, Pan Jisheng, Tong Shi Wun, Wang Shijie, Pennycook Stephen J., Goh Kuan Eng Johnson, Wee Andrew Thye Shen, Wong Swee Liang, Chi Dongzhi | ACS Nano |