| Publication date | Communities | Collections | Article title | Author(s) | Journal/Conference |
|---|---|---|---|---|---|
| 13 Apr 2016 | SERC | Institute of Microelectronics | 0.2 V 8T SRAM With PVT-Aware Bitline Sensing and Column-Based Data Randomization | Anh Tuan Do, Zhao Chuan Lee, Bo Wang, Ik-Joon Chang, Xin Liu, Tony Tae-Hyoung Kim | IEEE Journal of Solid-State Circuits |