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5 Jan 2022
SERC
Institute of Microelectronics
Heating Dissipation Discussion of TSV-integrated Ion Trap with Glass Interposer
Peng Zhao,
Xin Wen Bi,
Hong Yu Li,
Yu Dian Lim,
Wen Wei Seit,
Luca Guidoni,
Chuan Seng Tan
2021 IEEE 23rd Electronics Packaging Technology Conference (EPTC)
20 Sep 2021
SERC
Institute of Microelectronics
RF Performance Benchmarking of TSV Integrated Surface Electrode Ion Trap for Quantum Computing
Peng Zhao,
Hong Yu Li,
Jing Tao,
Jean-Pierre Likforman,
Yu Dian Lim,
Wen Wei Seit,
Luca Guidoni,
Chuan Seng Tan
IEEE Transactions on Components, Packaging and Manufacturing Technology
17 Aug 2021
SERC
Institute of Microelectronics
Design and Fabrication of Silicon Gratings for the Optical Addressing of Trapped Ion Qubits
Yu Dian Lim,
Hong Yu Li,
Peng Zhao,
Jing Tao,
Luca Guidoni,
Chuan Seng Tan
Conference on Lasers and Electro-Optics
7 Jul 2021
SERC
Institute of Microelectronics
Design and Fabrication of Grating Couplers for the Optical Addressing of Trapped Ions
Yu Dian Lim,
Hong Yu Li,
Peng Zhao,
Jing Tao,
Luca Guidoni,
Chuan Seng Tan
IEEE Photonics Journal
1 May 2021
SERC
Institute of Microelectronics
Large‐Scale Fabrication of Surface Ion Traps on a 300 mm Glass Wafer
Jing Tao,
Jean-Pierre Likforman,
Peng Zhao,
Hong Yu Li,
Theo Henner,
Yu Dian Lim,
Wen Wei Seit,
Luca Guidoni,
Chuan Seng Tan
physica status solidi (b)
19 Mar 2021
SERC
Institute of Microelectronics
Structural Integrity of 3-D Metal–Insulator–Metal Capacitor Embedded in Fully Filled Cu Through-Silicon via
Ye Lin,
Hong Yu Li,
Chuan Seng Tan
IEEE Transactions on Components, Packaging and Manufacturing Technology
21 Dec 2020
BMRC
Institute of Molecular and Cell Biology
Remodelling of whole-body lipid metabolism and a diabetic-like phenotype caused by loss of CDK1 and hepatocyte division
Jin Rong Ow,
Matias J Caldez,
Gözde Zafer,
Juat Chin Foo,
Hong Yu Li,
Soumita Ghosh,
Heike Wollmann,
Amaury Cazenave-Gassiot,
Chee Bing Ong,
Markus R Wenk,
Weiping Han,
Hyungwon Choi,
Philipp Kaldis
eLife
1 Aug 2015
SERC
Institute of Microelectronics
Fabrication and Assembly of Cu-RDL-Based 2.5-D Low-Cost Through Silicon Interposer (LC–TSI)
Guruprasad Katti,
David Soon Wee Ho,
Hong Yu Li,
Rahul Dutta,
Roshan Weerasekera,
Ka Fai Chang,
Jong-Kai Lin,
Vempati Srinivasa Rao,
Surya Bhattacharya
IEEE Design & Test
23 Jun 2015
SERC
Institute of Microelectronics
Heterogeneous 2.5D integration on through silicon interposer
Xiaowu Zhang,
Jong Kai Lin,
Sunil Wickramanayaka,
Songbai Zhang,
Roshan Weerasekera,
Rahul Dutta,
Ka Fai Chang,
King-Jien Chui,
Hong Yu Li,
David Ho,
Liang Ding,
Guruprasad Katti,
Suryanarayana Bhattacharya,
Dim-Lee Kwong
Applied Physics Reviews
1 Nov 2013
SERC
Institute of Microelectronics
Relationship Between Wafer-Level Warpage and Cu Overburden Thickness Controlled by Isotropic Wet Etching for Through Si Vias
Steven Lee Hou Jang,
Ramana Murthy,
Eugene Tan Swee Kiat,
Jae Woong Choi,
Lee Guan Ong,
Hong Yu Li,
Soon Wook Kim,
Gil Ho Hwang
IEEE Transactions on Components, Packaging and Manufacturing Technology
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