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18 Mar 2024 SERC Institute of Microelectronics Process Development and Integration on Si Substrate for Ion trap-based Quantum Processors H. Y. Li, Clarence Liu Huihong, Norhanani Jaafar, Morteza Ahmadi, Mishra Dileep Kumar, Goh Chun Kiat Simonl, Zhou YanYan, Manas Mukherjee, Chui King Jien 2023 IEEE 25th Electronics Packaging Technology Conference (EPTC)
21 Jan 2022 SERC Institute of Microelectronics Development, Testing, and Integration of Silicon and Glass Substrates for Advanced Ion Trap Design P. Zhao, Y. D. Lim, H. Y. Li, J. Tao, L. Guidoni, C. S. Tan 2021 IEEE 16th Nanotechnology Materials and Devices Conference (NMDC)
5 Jan 2022 SERC Institute of Microelectronics Wafer-to-Wafer Hybrid Bonding Challenges for 3D IC Applications H. Y. Li, Hong Miao Ji, Alfred Neo Siang Kiat, Masaya Kawano 2021 IEEE 23rd Electronics Packaging Technology Conference (EPTC)
23 Mar 2021 SERC Institute of Microelectronics TSV-integrated surface electrode ion trap for scalable quantum information processing P. Zhao, J. P. Likforman, H. Y. Li, J. Tao, T. Henner, Y. D. Lim, W. W. Seit, C. S. Tan, L. Guidoni Applied Physics Letters
7 Jul 2015 SERC Institute of Microelectronics Study of Multilevel High-Resistance States in HfO<sub><italic>x</italic></sub>-Based Resistive Switching Random Access Memory by Impedance Spectroscopy H. K. Li, T. P. Chen, S. G. Hu, P. Liu, Y. Liu, P. S. Lee, X. P. Wang, H. Y. Li, G. Q. Lo Electron Devices, IEEE Transactions on