| Publication date | Communities | Collections | Article title | Author(s) | Journal/Conference |
|---|---|---|---|---|---|
| 28 Jan 2016 | SERC | Institute of Materials Research and Engineering | Temperature-dependent microstructural evolution of Ti 2 AlN thin films deposited by reactive magnetron sputtering | Zheng Zhang, Hongmei Jin, Jianwei Chai, Jisheng Pan, Hwee Leng Seng, Glen Tai Wei Goh, Lai Mun Wong, Michael B. Sullivan, Shi Jie Wang | Applied Surface Science |