Collapse

Search results

Publication date Communities Collections Article title Author(s) Journal/Conference
9 Dec 2020 SERC Advanced Remanufacturing and Technology Centre Capacitance-based Contactless Monitoring of Aseptic Package Integrity and Content Quality HARI KRISHNA SALILA VIJAYALAL MOHAN, ANDREW ALEXANDER MALCOLM, Fang Cheng 2020 IEEE SENSORS
9 Dec 2020 SERC Advanced Remanufacturing and Technology Centre A Low-Cost Capacitance-based Non-Destructive Evaluation Platform for Fast Moving Consumer Goods (FMCG) Industrial Applications HARI KRISHNA SALILA VIJAYALAL MOHAN, ANDREW ALEXANDER MALCOLM, Fang Cheng 2020 IEEE SENSORS
14 Nov 2020 SERC Advanced Remanufacturing and Technology Centre Low-cost contactless monitoring of aseptic package integrity and content quality using capacitance HARI KRISHNA SALILA VIJAYALAL MOHAN, ANDREW ALEXANDER MALCOLM, Fang Cheng Food Packaging and Shelf Life
1 Jan 2020 SERC Advanced Remanufacturing and Technology Centre Surface Topography Measurement of Mirror-Finished Surfaces Using Fringe-Patterned Illumination Shaowei Fu, Fang Cheng, Tegoeh Tjahjowidodo Metals
15 Nov 2019 SERC Advanced Remanufacturing and Technology Centre Development of an Image Grating Sensor for Position Measurement Shaowei Fu, Fang Cheng, Tegoeh Tjahjowidodo, Mengjun Liu Sensors
16 Oct 2019 SERC Advanced Remanufacturing and Technology Centre Image grating: a novel technology for position measurement Shaowei Fu, Fang Cheng, Tegoeh Tjahjowidodo, Mengjun Liu Proceedings of SPIE
31 Aug 2019 SERC Advanced Remanufacturing and Technology Centre Surface Texture Evaluation on Mirror Finish Surface Using Patterned Area Illumination Method Shaowei Fu, Fang Cheng, Tegoeh Tjahjowidodo 2019 International Conference on Advanced Surface Enhancement
13 Aug 2018 SERC Advanced Remanufacturing and Technology Centre A Non-Contact Measuring System for In-Situ Surface Characterization Based on Laser Confocal Microscopy Yu Zhou, David Butler, Fang Cheng, Shaowei Fu, Tegoeh Tjahjowidodo Sensors
8 Aug 2018 SERC Advanced Remanufacturing and Technology Centre Process Optimization: Internal Feature Measurement for Additive-Manufacturing Parts using X-Ray Computed Tomography Dawei Xu, Fang Cheng, Yu Zhou, Thaddie Natalaray, Pei Xian Lim, Liping Zhao 10th International Symposium on Precision Engineering Measurements and Instrumentation
5 Sep 2013 BMRC Genome Institute of Singapore Genome-wide Association Analysis of Blood-Pressure Traits in African-Ancestry Individuals Reveals Common Associated Genes in African and Non-African Populations Nora Franceschini, Ervin Fox, Zhaogong Zhang, Todd L. Edwards, Michael A. Nalls, Yun Ju Sung, Bamidele O. Tayo, Yan V. Sun, Omri Gottesman, Adebawole Adeyemo, Andrew D. Johnson, Murielle Bochud, Ulrich Broeckel, Steven C. Hunt, Donna Arnett, Susan Redline, Richard S. Cooper, Neil J. Risch, D.C. Rao, Jerome I. Rotter, Aravinda Chakravarti, Alex P. Reiner, Daniel Levy, Brendan J. Keating, Xiaofeng Zhu, J. Hunter Young, Ken Rice, Qing Duan, Fang Chen, Yun Li, Hua Tang, Myriam Fornage, Keith L. Keene, Jeanette S. Andrews, Jennifer A. Smith, Jessica D. Faul, Zhang Guangfa, Wei Guo, Yu Liu, Sarah S. Murray, Solomon K. Musani, Sathanur Srinivasan, Digna R. Velez Edwards, Heming Wang, Lewis C. Becker, Pascal Bovet, Michel Burnier, Cara Carty, Daniel I. Chasman, Georg Ehret, Wei-Min Chen, Guanjie Chen, Wei Chen, Jingzhong Ding, Albert W. Dreisbach, Michele K. Evans, Xiuqing Guo, Melissa E. Garcia, Rich Jensen, Margaux F. Keller, Guillaume Lettre, Vaneet Lotay, Lisa W. Martin, Jason H. Moore, Alanna C. Morrison, Thomas H. Mosley, Adesola Ogunniyi, Walter Palmas, George Papanicolaou, Alan Penman, Joseph F. Polak, Paul M. Ridker, Babatunde Salako, Andrew B. Singleton, Daniel Shriner, Kent D. Taylor, Ramachandran Vasan, Kerri Wiggins, Scott M. Williams, Lisa R. Yanek, Wei Zhao, Alan B. Zonderman, Diane M. Becker, Gerald Berenson, Eric Boerwinkle, Erwin Bottinger, Mary Cushman, Charles Eaton, Fredrik Nyberg, Gerardo Heiss, Joel N. Hirschhron, Virginia J. Howard, Konrad J. Karczewsk, Matthew B. Lanktree, Kiang Liu, Yongmei Liu, Ruth Loos, Karen Margolis, Michael Snyder, Bruce M. Psaty, Nicholas J. Schork, David R. Weir, Charles N. Rotimi, Michele M. Sale, Tamara Harris, Sharon L.R. Kardia The American Journal of Human Genetics