Publication date | Communities | Collections | Article title | Author(s) | Journal/Conference |
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10 Aug 2021 | SERC | Institute of Microelectronics | Case studies of accurate fault localization in advanced packages | Sajay Bhuvanendran Nair Gourikutty, Jesse Alton, Desmond Yeo, Kok Keng Chua, Sharon Lim Seow Huang, Surya Bhattacharya | 2021 IEEE 71st Electronic Components and Technology Conference (ECTC) |