| Publication date | Communities | Collections | Article title | Author(s) | Journal/Conference |
|---|---|---|---|---|---|
| 22 Nov 2019 | SERC | Institute of Materials Research and Engineering | Chapter 7: STM/STS and ARPES Characterisation – Structure and Electronic Properties | Fabio Bussolotti, DongZhi Chi, Kuan Eng Johnson Goh, Yuli Huang, Andrew Wee | 2D Semiconductor Materials and Devices |