Citation:
Tian, S. I. P., Ren, Z., Venkataraj, S., Cheng, Y., Bash, D., Oviedo, F., Senthilnath, J., Chellappan, V., Lim, Y.-F., Aberle, A. G., MacLeod, B. P., Parlane, F. G. L., Berlinguette, C. P., Li, Q., Buonassisi, T., & Liu, Z. (2023). Tackling data scarcity with transfer learning: a case study of thickness characterization from optical spectra of perovskite thin films. Digital Discovery, 2(5), 1334–1346. https://doi.org/10.1039/d2dd00149g