Universal deep learning representation of effective refractive index for photonics channel waveguides

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Universal deep learning representation of effective refractive index for photonics channel waveguides
Title:
Universal deep learning representation of effective refractive index for photonics channel waveguides
Journal Title:
Journal of the Optical Society of America B
Publication Date:
04 September 2019
Citation:
Alagappan, G., & Png, C. E. (2019). Universal deep learning representation of effective refractive index for photonics channel waveguides. Journal of the Optical Society of America B, 36(10), 2636. doi:10.1364/josab.36.002636
Abstract:
An optical waveguide is the fundamental element in a photonic integrated circuit. This paper establishes a universal deep learning representation for the effective refractive index of an optical channel waveguide for the entire and usual parameter space for applications in photonics. The deep learning model is able to make precise predictions for wide spectrum optical wavelengths, dielectric materials of refractive indices varying from 1.45 to 3.8, and a wide range of feasible geometrical parameters of the waveguides. The deep learning model consists of fully connected feedforward neural networks, and rigorous optimization of neural network architecture is carried out. Deep learning models with two and three hidden layers provide rapid convergence with a minimal number of training data points and offer unprecedented precisions that are a few orders better in magnitude than the conventional interpolation techniques.
License type:
Publisher Copyright
Funding Info:
This research / project is supported by the A*STAR - A*STAR-NTU-SUTD AI Partnership Grant
Grant Reference no. : RGANS1901
Description:
© 2021 Optical Society of America. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modifications of the content of this paper are prohibited
ISSN:
1520-8540
0740-3224
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