Ong, J. R., Guo, T. X., Ang, T. Y. L., Lim, S. T., Wang, H., & Png, C. E. (2020). Wafer-Level Characterization of Silicon Nitride CWDM (De)Multiplexers Using Bayesian Inference. IEEE Photonics Technology Letters, 32(15), 917–920. doi:10.1109/lpt.2020.3004850
A cascaded Mach-Zehnder interferometer based filter for coarse wavelength (de)multiplexing (CWDM) at the O-band is fabricated and tested on a silicon nitride on SOI platform. We characterize the chip-to-chip performance variability of the filter devices on a wafer. Using the optical measurement data, we apply Bayesian inference methods to estimate the waveguide geometery parameters and also quantify the uncertainty of the estimates.
This research / project is supported by the A*STAR-NTU-SUTD AI Partnership - A*STAR-NTU-SUTD AI Partnership Grant
Grant Reference no. : RGANS1901