This is the peer reviewed version of the following article: Yousry, Y. M., Yao, K., Chen, S., Liew, W. H., Ramakrishna, S., Adv. Electron. Mater. 2018, 4, 1700562. https://doi.org/10.1002/aelm.201700562
, which has been published in final form at https://doi.org/10.1002/aelm.201700562. This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Use of Self-Archived Versions.