Modified Binary Ant Colony Optimization for Drift Compensation

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Modified Binary Ant Colony Optimization for Drift Compensation
Title:
Modified Binary Ant Colony Optimization for Drift Compensation
Journal Title:
2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)
Publication Date:
30 August 2021
Citation:
H. Shu and R. Y. -N. Wong, "Modified Binary Ant Colony Optimization for Drift Compensation," 2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA), 2021, pp. 1131-1135, doi: 10.1109/ICIEA51954.2021.9516232.
Abstract:
In data analytics and pattern recognition, feature selection is a critical task to provide a subset of features with minimum redundancy. This reduces the computation time as well as cost. In this manuscript, a correlation based feature selection approach based on a modified binary ant colony optimization algorithm (MBACO) is proposed. Combined with random forest regression, the proposed MBACO algorithm is customized for a drift compensation application. In this application, the ant road map is initialized to avoid the local optimum. The proposed method is compared with that of binary particle swarm optimization on a well-known UCI dataset. Experimental results show that the proposed method exhibits better performance over the binary particle swarm optimization based approach.
License type:
Publisher Copyright
Funding Info:
This research / project is supported by the Singapore Ministry of National Development and the National Research Foundation - Land and Liveability National Innovation Challenge (L2 NIC) Research Programme
Grant Reference no. : L2NICTDF1-2017-3
Description:
© 2021 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
ISSN:
2158-2297
2156-2318
ISBN:
978-1-6654-2248-2
978-1-6654-2247-5
978-1-6654-4671-6
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